Abstract
Parameters such as track diameter and microstruture of latent tracks in polycrystalline Si3N4 induced by 710 MeV Bi ions were studied using TEM and XRD techniques, and MD simulation. Experimental results are considered in terms of the framework of a ‘core–shell’ inelastic thermal spike (i-TS) model. The average track radius determined by means of electron microscopy coincides with that deduced from computer modelling and is similar to the track core size predicted by the i-TS model using a boiling criterion. Indirect (XRD) techniques give a larger average latent track radius which is consistent with the integral nature of the signal collected from the probed volume of irradiated material.
Highlights
The stability of solids against swift heavy ion irradiation (SHI) is usually related to the ability of projectiles to form latent tracks—highly disordered regions surrounding the ion trajectory
TEM examination Determination of the size of Bi ion tracks by means of TEM is done from high angle annular dark field (HAADF) STEM images
Several tracks are measured in this way and the average track diameter is determined from these results
Summary
V A Skuratov4,5,6 , V V Uglov, S V Zlotski, A E Volkov and M Zdorovets. Any further distribution of 13 Author to whom any correspondence should be addressed. This work must maintain attribution to the author(s) and the title of the work, journal citation
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
