Abstract
Bulk yttrium-iron garnet (YIG) single crystals have been irradiated with swift Kr and Xe ions having energies from 0.4 to 22.8 MeV/u and electronic stopping powers from 8.9 to 28.9 keV/nm near the irradiated surface. Transmission electron microscopy (TEM) has been used for direct observation of non-overlapping amorphous latent tracks in the near surface region of the irradiated bulk YIG crystals. The amorphous track radii observed in this work have been compared with previously reported data from direct and indirect measurements. It was found that the thickness of the sample subjected to swift heavy ion irradiation does not significantly affect the resulting amorphous track size observed by TEM in YIG. The results also support previously observed consistency between direct TEM and indirect Rutherford backscattering in channelling mode (RBS/C) and Mossbauer spectroscopy (MS) methods for amorphous track evaluation in YIG when electronic stopping power is greater than ∼13 keV/nm, which is sufficient to create cylindrical amorphous tracks by high velocity ions (E > 10 MeV/u). Indirect methods provide underestimated values compared to TEM when the electronic stopping power is below ∼13 keV/nm, for which discrete amorphous tracks are supposed to be formed by high velocity ions.
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