Abstract
Latent ion tracks in mica have been studied using scanning force microscopy (SFM) on freshly cleaved samples in air and under vacuum conditions. The tracks have been produced by irradiating mica with 2.8 MeV/u uranium ions. The topography images were recorded simultaneously both in forward and backward scanning direction. When scanning in air a strong friction force on the latent ion tracks complicates the analysis of their topography. Since we measured in vacuum these hillocks can be seen due to a drastically reduced friction. Thus, we observed hillocks of about 0.5 nm height.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
