Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting

Abstract

A single-pulse imaging laser projection system (laser monitor) is proposed for real-time monitoring high-speed processes shielded by the intensive background lighting. The brightness temperature of the lighting can reach thousands or even tens of thousands of degrees, which makes it difficult to observe the processes with the naked eye. The estimates of limiting temperatures show that the use of the proposed instrument allows to view the objects when the equivalent brightness temperature of the background lighting is up to 45,000 K. The results of visualization of some bright objects and processes using high-speed copper bromide vapor laser monitor are presented.