Abstract
Lock-in thermography was applied to determine the thermal contact conductance of a W-layer (140μm) on a CFC-substrate. A lock-in thermography system together with a pulse repetition rate Nd:YAG laser (1064nm, 1–500Hz pulse repetition rate) for layer heating was applied for phase shift measurements on the W-layer. A numerical model for direct phase shift calculations was developed and applied to rapid determination of the Fourier amplitudes and phases of the temperature. Thermal conductance coefficients were obtained by comparing the experimental and simulation phase shifts.
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