Abstract
Wide-field lensfree on-chip microscopy, which leverages holography principles to capture interferometric light-field encodings without lenses, is an emerging imaging modality with widespread interest given the large field-of-view compared to lens-based techniques. In this study, we introduce the idea of laser light-field fusion for lensfree on-chip phase contrast microscopy for detecting nanoparticles, where interferometric laser light-field encodings acquired using a lensfree, on-chip setup with laser pulsations at different wavelengths are fused to produce marker-free phase contrast images of particles at the nanometer scale. As a proof of concept, we demonstrate, for the first time, a wide-field lensfree on-chip instrument successfully detecting 300 nm particles across a large field-of-view of ~30 mm2 without any specialized or intricate sample preparation, or the use of synthetic aperture- or shift-based techniques.
Highlights
We demonstrate, for the first time, a lensfree on-chip instrument capable of detecting 300 nm particles across a large field-of-view of ~30 mm[2] without utilization of specialized or intricate sample preparation, or the use of synthetic aperture- or lateral shift-based techniques
It can be observed that the same nanospheres observed by the Scanning electron microscopy (SEM) cannot be detected using the reference lensfree on-chip instrument capturing interferometric light-field encodings at λ = 531.9 nm
It can be observed that the same nanospheres observed by the SEM have been detected with the proposed laser light-field fusion phase contrast microscopy instrument, demonstrating its ability to detect particles that are 495 nm in size as well as achieve superior performance to the reference lensfree on-chip instrument
Summary
Wide-field lensfree on-chip microscopy, where holography principles are used to capture interferometric light-field encodings without lenses, has become an interesting pathway toward addressing the shortcomings of lens-based techniques[2,3,4,5,6,7,8,9,10,11,12,13,14,15,16,17,18,19,20,21,22]. The ability to harness the principles behind wide-field lensfree on-chip microscopy for detecting nanoparticles holds considerable promise for greatly reducing imaging cost and complexity while improving image throughput and FOV, enabling comprehensive, large scale studies to be more readily achieved. A method to achieve wide-field lensfree on-chip microscopy for detecting nanoparticles without the need for additional specialized sample preparation, or the use of synthetic aperture- or lateral shift-based techniques is highly desired. We demonstrate, for the first time, a lensfree on-chip instrument capable of detecting 300 nm particles across a large field-of-view of ~30 mm[2] without utilization of specialized or intricate sample preparation, or the use of synthetic aperture- or lateral shift-based techniques
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