Abstract
A chromium (Cr) grating pitch standard is fabricated by a technique of laser-focused atomic deposition. Cosine errors of the grating standard are analyzed and controlled under a relative error of 6×10−6 after 10-times iterative calibration. The dimension properties of the standard are measured and analyzed by a calibrated metrological atom force microscope (AFM) with large range. The experimental results show the grating standard has a good uniformity and structural periodicity. Hence, the laser-focused Cr atomic deposition grating can work as a reference standard.
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