Laser energy effect on the properties of ZnS thin films prepared by PLD technique

Esraa K Hamed

doi:10.30723/ijp.v11i21.371

Abstract

Zinc sulfide (ZnS) thin films were deposited on glass substrates using pulsed laser deposition technique. The laser used is the Q-switched Nd: YAG laser with 1064nm wavelength and 1Hz pulse repetition rate and varying laser energy 700mJ-1000mJ with 25 pulse. The substrate temperature was kept constant at 100°C. The structural, morphological and optical properties of ZnS thin films were characterized with X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscope (AFM) and UV-VIS spectrophotometer.

Highlights

Zinc sulphide belongs to II-VI group compound material with large direct band gap between 3.4-3.7eV depending upon composition
The structural, morphological and optical properties of Zinc sulfide (ZnS) thin films were characterized with X-ray diffraction (XRD), atomic force microscope (AFM) and UVVIS spectrophotometer
Optical Properties Optical properties of ZnS thin films were determined from the transmission, absorption and reflection measurements in the range of 300-800 nm

Summary

Introduction

Zinc sulphide belongs to II-VI group compound material with large direct band gap between 3.4-3.7eV depending upon composition. In recent years ZnS attracted much attention because the properties in nano form differ significantly from those of their bulk counter parts. Much effort has been made to control the size, morphology and crystalline of ZnS thin films. Interest in developing techniques for preparing semiconductor nano particles and films. Experimental ZnS thin films were deposited by using the pulsed laser deposition technique. Q-switched Nd: YAG laser with a wavelength of 1064 nm with different laser energies (700mJ-1000mJ) and fixed number of pulses (25 pulse) was used; the focal length for the lens was about 13cm with a repetition rate of 1 Hz. The distance between the target and the substrate was kept at 2.5 cm. The structural, morphological and optical properties of ZnS thin films were characterized with X-ray diffraction (XRD), atomic force microscope (AFM) and UVVIS spectrophotometer

Results and Discussion

Structural and morphological properties

Conclusions