Abstract
The electrically induced quenching of the photoluminescence (PL) intensity and fracture in a single ZnO nanowire were investigated. As the applied voltage increases, the quenching of PL intensity and the red-shift of ultraviolet (UV) emission peak were clearly observed, which are explained by the current-induced Joule heating in the ZnO nanowire. By using this mechanism, the UV laser was successfully used to monitor the safe current density and identify the current-induced fracture in a single ZnO nanowire.
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