Abstract
A technique is described for tandem mass spectrometry of individual microparticles in an ion trap mass spectrometer. The particles are sampled by laser desorption/ablation after being injected into the center of the ion trap electrodes. The method is especially effective for the detection of trace levels of involatile organic molecules. Test particles were 100 {mu}m silicon carbide grains coated with tetraphenylphosphonium bromide. Mass spectra of the primary ions and fragment ions following collision-induced dissociation were measured. 30 refs., 6 figs.
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