Abstract
Recent developments have allowed x-ray diffraction techniques atsynchrotron radiation facilities to be employed with a temporal resolution ofaround 1 ps. These developments are the availability of firstly, highbrightness third-generation x-ray sources, secondly, passively mode-lockedlasers with 100 fs temporal duration and thirdly, averaging streak cameraswith sub-picosecond temporal resolution. In this paper, we discuss how thesenovel devices are combined in time-resolved x-ray diffraction experiments atsynchrotron radiation facilities.
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