Large-Scale Dimensional Metrology: The New Paradigm of Distributed Systems

Abstract

Besides classical centralized metrology instruments in which a stand-alone unit works independently to provide geometrical features of the object to be measured, recent approaches to Large-Scale Dimensional Metrology seem to turn their attention towards distributed metrology systems made of multiple components with small dimensions spread around the measuring volume. In general this network of sensors allows rapid dimensional measurements to be performed in relation to large-sized objects, with typical dimensions of several decametres. Distributed metrology systems introduce a new paradigm in the field of Large-Scale Dimensional Metrology, reversing the classical approach to dimensional metrology. Due to their nature, they are portable and can be easily transferred around the volume where the measurand is, instead of moving the measurand to the measuring machine. Compared to centralized systems, distributed systems may cover larger measuring volumes, with no need to reposition the instrumentation devices around the measured object. Portability, reconfigurability and ease of installation make these systems attractive for many industries that manufacture large-scale products.