Abstract
Background. The anisotropy of the transverse magnetoresistance of single-crystal nickel films was studied in this work. The measurements were carried out on samples whose surface plane coincided with the [001] plane. Studies of the magnetoresistance in a single-crystal nickel film have shown the effect of tensile stresses acting on it from the side of magnesium oxide. The modification of the anisotropy of magnetoreflection of a film on a substrate as compared to a free sample is apparently associated with a change in the shape of the Fermi surface of carriers.
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