Abstract
Techniques for achieving large grain structure (2–5 μm diameter crystallites) in thin Te films (∼ 1000 Å thick) via Au-nucleation and annealing are discussed. X-ray diffraction data from annealed Te films indicate high quality Te grains which are preferentially oriented (with (100) planes parallel to the substrate). A method for forming tellurium oxide via plasma anodization of Te films is also discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
