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Abstract
The coexistence of Al and Si has a significant impact on the electromagnetic shielding effectiveness (SE) of Ti3(Al, Si)C2 ceramics and the total SE (SET) peaked when mol(Al): mol(Si) = 1:1. Ti3(Al1/2Si1/2)C2 ceramic exhibit high SET around 47 dB and excellent frequency-stability within X-band frequency. The high SET originates from both high reflection and absorption. High reflection is related to the larger amounts of defects, while high absorption was ascribed to the higher Ohimic loss and coarse microstructure which is beneficial for multiple reflections. Results indicate that Ti3(Al1/2Si1/2)C2 ceramic could be considered as promising structural electromagnetic shielding materials.
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