Abstract
The effects of external stresses on ferroelectric properties of Pb(Zr,Ti)O 3 thin film capacitors were studied with a phenomenological Landau–Khalatnikov equation. In this simulation, Landau free energy density functional ( G) considering the interaction between ferroelectric polarization ( P) and external stresses (σ) was used; G ̂ =a 1P 2+a 11P 4+a 111P 6−Q′ 12(σ 1 2+σ 2 2)P 2−EP. As reported experimentally, polarization and coercive field increased with compressive stress. With tensile stress, however, polarization and coercive field decreased. The simulated external stress effects on ferroelectric properties are in good agreement with experimental results of quadratic dependence.
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