Abstract
PurposeThis paper seeks to detail the fabrication of a glass‐ceramic substrate, based on the LiO2‐ZrO2‐SiO2‐Al2O3 (LZSA) system, by laminated object manufacturing (LOM) using water‐based cast tapes.Design/methodology/approachSmall amounts of ZrSiO4 were added to control the thermal expansion coefficient (TEC) of the original glass‐ceramic (LZSA5Zr: LZSA+5 wt% ZrSiO4). In order to verify the influence of the amount and nature of crystalline phases on the thermal and dielectric behavior of the material, LZSA and LZSA5Zr laminates were sintered at 700°C for 30 min and crystallized at either 800 or 850°C for 30 min.FindingsLZSA laminates (sintered and crystallized at 700 and 800°C, respectively) exhibited a relative density of ∼90 percent, a dielectric constant of 8.39, a dielectric loss tangent of 0.031 and TEC of 5.5×10−6 K−1 (25‐550°C). The addition of 5 wt% ZrSiO4 to original LZSA glass‐ceramics led to a nearly constant TEC value of 6×10−6 K−1 throughout the whole temperature interval (25‐800°C). Dielectric properties of LZSA5Zr did not show any remarkable change when compared to original LZSA.Originality/valueThe thermal, mechanical and electrical properties of LZSA glass‐ceramic laminates fabricated by LOM makes them potential candidates for substrate applications.
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