Abstract

PurposeThis paper seeks to detail the fabrication of a glass‐ceramic substrate, based on the LiO2‐ZrO2‐SiO2‐Al2O3 (LZSA) system, by laminated object manufacturing (LOM) using water‐based cast tapes.Design/methodology/approachSmall amounts of ZrSiO4 were added to control the thermal expansion coefficient (TEC) of the original glass‐ceramic (LZSA5Zr: LZSA+5 wt% ZrSiO4). In order to verify the influence of the amount and nature of crystalline phases on the thermal and dielectric behavior of the material, LZSA and LZSA5Zr laminates were sintered at 700°C for 30 min and crystallized at either 800 or 850°C for 30 min.FindingsLZSA laminates (sintered and crystallized at 700 and 800°C, respectively) exhibited a relative density of ∼90 percent, a dielectric constant of 8.39, a dielectric loss tangent of 0.031 and TEC of 5.5×10−6 K−1 (25‐550°C). The addition of 5 wt% ZrSiO4 to original LZSA glass‐ceramics led to a nearly constant TEC value of 6×10−6 K−1 throughout the whole temperature interval (25‐800°C). Dielectric properties of LZSA5Zr did not show any remarkable change when compared to original LZSA.Originality/valueThe thermal, mechanical and electrical properties of LZSA glass‐ceramic laminates fabricated by LOM makes them potential candidates for substrate applications.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call