Abstract

The lamellar-level morphology of an extruded poly(ethylene terephthalate) (PET)/poly(ethylene-2,6-naphthalate) (PEN) blend was investigated with small-angle X-ray scattering (SAXS). Measurements were made as a function of the annealing time in the melt and the crystallization temperature. The characteristic morphological parameters at the lamellar level were determined by correlation function analysis of the SAXS data. At a low crystallization temperature of 120 °C, the increased amorphous layer thickness was identified in the blend, indicating that some PEN was incorporated into the interlamellar regions of PET during crystallization. The blend also showed a larger lamellar thickness than pure PET. A reason for the increase in the lamellar thickness might be that the formation of thinner lamellar stacks by secondary crystallization was significantly restricted because of the increased glass-transition temperature. At high crystallization temperatures above 200 °C, the diffusion rates of noncrystallizable components were faster than the growth rates of crystals, with most of the noncrystallizable components escaping from the lamellar stacks. As a result, the blend showed an interfibrillar or interspherulitic morphology. © 2002 John Wiley & Sons, Inc. J Polym Sci Part B: Polym Phys 40: 317–324, 2002

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