Lamellar orientation in isotactic polypropylene thin films: a complement study via grazing incidence X-ray diffraction and surface/cross-sectional imaging

Abstract

The crystalline structures of isotactic polypropylene (iPP) thin films were investigated using grazing incident wide-angle X-ray diffraction (GIWAXD), atomic force microscopy (AFM), and transmission electron microscopy (TEM). The out-of-plane (110) reflection split with 99° inclination in the GIWAXD pattern. The film surface was covered with flat-on mother lamellae with orthogonal daughter lamellae. The cross-sectional TEM image and the fast Fourier transform-processed image showed vertically aligned daughter lamellae and cross-hatched lateral mother lamellae. Flat-on lamellae may be preferentially produced at the substrate interface, after which the mother lamellae may yield daughter lamellae from the ac plane to give vertically aligned lamellae. The daughter lamellae yield in-plane lamellae with flat-on alignment from the ac plane, resulting in the global growth of a cross-hatched lamellar structure.