Abstract
It is demonstrated that a slight modification of a laboratory EXAFS (extended X-ray absorption fine structure) spectrometer for fluorescence detection can greatly lower the limit of dilution. It can also extend samples studied to thin films on X-ray opaque substrates. Basically the system consists of a laboratory EXAFS spectrometer eguipped with two NaI scintillation counters combined with filters, and an SSD (solid state detector). Optimum experimental conditions are chosen by monitoring the output of the SSD, and then scintillation counters are used for measurements by making use of the large aperture. The performance of this system was tested by dilute aqueous solutions of Fe(NO3)3, 1000 and 5000 A thick iron film deposited on glass substrates, a 6 mM solution of octaethylporphyrin iron (III) chloride (Fe(OEP)Cl).
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