Abstract
A method is given for using the Kramers-Kronig dispersion relations to evaluate optical and dielectric parameters of materials from normal incidence reflectance data when data over only a limited spectral range is available. No assumptions are needed concerning the behaviour of the reflectance data outside the experimental range, and no extrapolations of data are required. As an example, the extreme ultra-violet reflectance data of potassium iodide is analysed by this method.
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