Abstract

Wet etching is commonly used to produce patterned copper films for printed circuit boards and semiconductor devices. The investigation of copper etching by FeCl 3 -HCl solutions in a batch stirred-tank reactor was undertaken to determine the intrinsic reaction kinetics. The variation of the etch rate with FeCl 3 concentration was linear at low concentrations and gave first-order rate constants of 0.2039, 0.3083, and 0.3362 mg Cu-kg H 2 O/cm 2 s.mol FeCl 3 at 30, 40, and 50 o C, respectively. At approximately 2 mol/kg the etch rate reached a maximum. Etch rates obtained with 0.85 and 2 mol/L HCI over the range of FeCl 3 concentration were similar. The etch rate was substantially reduced with the use of Fe(NO 3 ) 3 -HNO 3 solutions and increased uniformly as the chloride content of the solution was increased. Concentrations of the chloro complexes of the iron(III) ion were computed and showed that FeCl 2 + and FeCl 3 0 are the principal species present in the etchants studied. The etch rate was found to vary linearly with FeCl 2 + concentration at low (<1 mol/kg) concentrations. The maximum in the etch rate is attributed to the inhibition by FeCl 3 0 , the concentration of which becomes significant in etchants of greater than 2 mol/kg FeCl 3

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