Abstract
The kinetics of the gradual degradation of red AlGaAs light-emitting diodes (LED) has been studied. This degradation has been shown to be due to diffusion of Zn atoms from the GaAs substrate to the p-n+ junction. The gradual degradation kinetics has been described on the basis of a diffusion model. It has been ascertained that the Zn atom diffusion process is not recombination-enhanced. At the same time the process of elastic stress relaxation, occuring at the initial stage of the LED degradation, is enhanced by the flowing current.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.