Abstract
The theoretical models described in Part I of this series (Thermochim. Acta., 131 (1988) 211) were used to determine the crystallization kinetics of amorphous CdGeAs2. Implementation of correction techniques were found to be essential to reduce the data to the properties of isolated material and eliminate errors introduced by the DSC device itself. These corrections are discussed in detail for both the Perkin Elmer DSC7 (Perkin Elmer Corporation, Norwalk, CT, U.S.A.) and the DuPont 1090 DSC (E.I. DuPont de Nemours Inc., Wilmington, DE, U.S.A.), and the calculated kinetic parameters are compared for the two devices. The effect of the use of bulk samples as opposed to many fine granules is also discussed.
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