Abstract
Dielectric relaxation processes in the supercooled antiferroelectric smectic CA* phase and crystallization kinetics of two chiral fluorinated 5HF6 and 6HF6 compounds from the same homologous series are investigated. Fragility parameters are determined from the relaxation time of the α-process, including τHN from the Havriliak-Negami formula and τpeak denoting the position of the absorption peak. The coupling coefficient ξ between the characteristic time of isothermal cold crystallization and relaxation time of the α-process is obtained. Despite similar values of the fragility index, the even 6HF6 homologue undergoes cold crystallization much faster than the odd 5HF6 homologue, with significantly different ξ coefficients. Influence of the relaxation time of the PH process (anti-phase phason) in the smectic CA* phase on the crystallization kinetics is presumed.
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