Abstract
The results of investigation of formation plumbum telluride epitaxial films by atomic force microscopy are presented. The surface topology of PbTe films grown by hot wall method on micas-muscovite fresh cleavages substrates for 350 - 630 K condensation temperatures range and thickness up to 10 μm are given. This indicated the presence of the vapour - crystal growth processes of a films without a coalescence.
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