Abstract
This paper presents an anisotropy Monte Carlo algorithm to simulate grain growth in nanocrystalline films. The results indicate that a thickness effect appears only when the average grain size reaches 0.8–1.2 times the film thickness. A grain size-thickness factor is introduced to modify Burke’s grain growth kinetic equation, better describing the whole process of grain growth in both simulation and Ni/SiO2 nanocrystalline multilayer films. A more universal kinetic equation of grain growth is further suggested.
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