Abstract
The growth of pentacene thin films on Cu(110)‐(2 × 1)O surface was investigated in situ and in real time using reflectance difference spectroscopy (RDS). Deposition at a substrate temperature of 230 K results in a lying‐down orientation for all pentacene molecules. Subsequent annealing to a temperature of 350 K induces reorientation for molecules above the first monolayer into a standing‐up configuration. By a quantitative analysis on the corresponding evolution of the RD signals, the kinetic barrier of meV has been deduced for the reorientation of pentacene molecule.
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