Abstract
Surface structures and electronic properties of submonolayer thiophene C4H4S adsorbed on Cu(100) (0.07 ML, 220 K) and Ni(100) (0.10 ML, 43 K) have been investigated by means of S K-edge surface extended X-ray-absorption fine structure (SEXAFS), near-edge X-ray-absorption fine structure (NEXAFS) and S 1s X-ray photoemission spectroscopy (XPS) measurements. It is revealed that the C4H4S molecules adsorb with the molecular plane parallel to the surface and the S atom locates at the bridge site on both surfaces. The distances of S-substrate atoms, and of the SC bond in C4H4S, as well as the degree of charge transfer from the substrate to the C4H4S π∗ orbital were determined. These results indicate that C4H4S interacts more strongly with the Ni substrate than with the Cu substrate.
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