Abstract
This paper describes an evaluation of the Keysight 3458A digital multimeter (DMM) noise performance. A DMM noise model is given in closed form for all ranges and integrating analog-to-digital converter (IADC) aperture times. When the DMM is used for sampling, different sources of noise contribute to the total noise of the sampled signal. Their combined effect was measured using both short-circuited input terminals and spectrally pure Josephson arbitrary waveform synthesizer. Both white noise and ${1/f}$ noise were evaluated. The results confirmed that the internal IADC can be used to measure DMM input referred noise when the IADC quantization noise is smaller than the instrument front-end analog circuitry-related noise. Further, it is shown that the DMM noise can be effectively measured with short-circuited input terminals when using double integer output format, but not always when using single integer output format. The manufacturer specifications were confirmed on all but the 100-V range.
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