Abstract
Kerr rotation angles, θK, at 780 nm of an optical wavelength, λ, are measured at room temperature for RE(Gd, Tb, Dy, Nd)-Co sputtered films in a wide range of RE content. The absolute rotation angle |θK| decreases linearly with an increase in RE content. This compositional dependence of θK is analyzed using the mean field theory. From this analysis, it is found that the absolute value of θK is proportional to the Co sublattice magnetic moment, MCo, with the coefficient of about 3.3 × 10-4 deg·cm3 / emu at δ = 780 nm. This linear relation indicates that θK of RE-Co films arises mainly from the Co moment, MCo, at this wavelength. Furthermore, the Kerr rotations of Co-Ti, Co-Zr and Co-Cr sputtered films are measured. They are also proportional to the saturation magnetization, Ms, with the coefficients of values nearly equal to those of RE-Co films.
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