Abstract
Magneto-optical effects are calculated for the film stack consisting of hemisphere glass/magnetic film (10 nm)/air gap (d nm)/glass plate. Polarized light (wave length=800 nm) is irradiated through the hemisphere glass in the total internal reflection configuration. A typical amorphous rare earth-transition metal alloy is used for the magnetic layer. We find a large monotonic change in the figure of merit (product of the reflected amplitude of light and the Kerr rotation angle) as a function of the air gap, ranging from 1 to 800 nm. Similar results are obtained for a magnetic film with a 10 nm SiO2 protective layer and for a 1-nm-thin magnetic film. This phenomenon is mostly caused by a change in the reflectivity at magnetic film/air interface due to photon tunneling. The difference in the figure of merit between perpendicular and longitudinal magnetization is about 0.6°. These results imply that it might be possible to obtain an image of perpendicular magnetic moment with photon scanning tunnel microscopy (STM). This method can be combined simultaneously with a conventional atomic force microscope or STM.
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