Abstract
Kelvin probe force microscopy measurements of the clean (001) surface of UHV cleaved MgO and of the same surface with supported palladium nanoclusters are presented. Kelvin images of the clean surface show a bright contrast at steps, pits, and fragments of MgO. The bright contrast is due to negatively charged defects, which deliver the surface a net negative charge. Kelvin images of supported Pd nanoclusters exhibit a mean voltage difference of 2.4 V between Pd clusters and the MgO(001) surface. It is shown that the voltage difference equals the work function difference between MgO(001)/Mo and Pd, which was found by recent MIES and UPS measurements.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
