Abstract

K shell fluorescence yields for As, Se, Br, Rb, Sr, Zr, Nb, Mo Ru, Pd, Ag, Cd, In, Sn, Sb, Te and I are reported. The experimental values of the fluorescence yields were determined by measuring K X-ray fluorescence and incoherent scattered γ-ray spectrum induced by 59.5 keV photons employing a Ge(Li) detector system in a reflection geometry set-up. For measuring the K shell fluorescence yield, the intensity ratio of K X-rays to incoherently scattered γ-rays was used. For this reason, carbon was used as a scattering target. The experimental results are compared with literature experimental values, theoretical predictions, and semiempirical fits.

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