K-Ar dating of extensional fault gouge from the Yi-Shu segment of the Tan-Lu fault zone

Abstract

Two grabens were developed in the Yi-Shu segment of the Tan-Lu fault zone (TLFZ) during its extensional activities, and are now confined by four major NNE-trending normal faults and filled with Cretaceous sediments. These faults were developed due to their reactivities, containing gouge and cutting the graben sediments. Detailed fieldwork demonstrates that the faults experienced sinistral transtensional moment related to regional NE-SW extension during the reactivity. X-ray diffraction (XRD) analysis of the finest gouge samples gives illite crystallinity values higher than 0.42°Δ2θ, indicating temperatures experienced by the gouge samples were less than 150°C. From the relation between K-Ar data and proportions of detrital illite in different size fractions of the gouge samples, we conclude that refaulting for the western boundary fault of the TLFZ, abbreviated to F4, took place at ca. 90 Ma and for the eastern boundary fault, abbreviated to F1, happened from 70 to 60 Ma. During the two phases of reactivity imposed by the same NE-SW extension, the TLFZ experienced uplifting and no sediments were deposited in the two grabens. It is suggested that the TLFZ experienced extension during the Late Cretaceous, which supports the inference that lithospheric thinning was still undergoing in the east of the North China Craton during the Late Cretaceous magmatic hiatus.