Abstract
K shell X-ray intensity ratios (Kβ/Kα) were measured for elements of intermediate atomic number (20 ⩽Z⩽ 49). Photon excited characteristic X-rays from thin-film samples were detected using a high-resolution Si(Li) detector system. The X-ray intensities thus obtained were corrected for the detection efficiency of the system and self-absorption effects within the sample. The results obtained were in good agreement with theoretical values. Relative intensities for L3 sub-shell X-rays, i.e., Lα/Ll, are also reported for heavier atomic number elements at photon excitation energies correspoinding to Ag K X-rays.
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