Abstract
The observation of Josephson effect in high-Tc La2−xSrxCuO4/La2−xSrxCuO4 (LSCO/LSCO) ramp-edge junctions is reported. The LSCO/LSCO ramp-edge junctions are fabricated by pulsed laser deposition, Ar ion milling, and photolithography techniques adopting an interface-engineered process. The fabricated junctions have the maximum Josephson current Ic of a few hundred microamperes and clear Shapiro steps are observable under microwave irradiation. The modulation of Ic under an external magnetic field is also recognized.
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