Abstract
A method is presented for joint least-squares fit of a temperature dependent model simultaneously to a set of impedance spectra measured at various temperatures. Software implementation of the simplex method is capable of handling large sets of data and provides estimates of model parameters and their standard deviations. The joint analysis follows and completes the standard procedure made in two-steps: (1) least-squares fit of a model to individual spectra; (2) evaluation of dependence of model parameters on the control variable. Both methods are applied to analyze a set of 20 impedance spectra of an oxide ion conductor Bi 2V 0.5Mg 0.5O 4.75. Identical values of resistance of the solid electrolyte are obtained by both methods. Substantially different temperature dependence is, however, obtained for parameters of the equivalent circuit describing relaxation of ionic charge carriers and interfacial impedance. The joint analysis allows direct estimation of temperature independent parameters, like coefficients of instrumental correction. Comparison between various forms of temperature dependence can be performed in statistically significant manner.
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