Joint application of refraction static correction and tomographic inversion static correction

Abstract

The main static correction methods for complex areas include first arrival refraction statics and tomographic inversion. Neither method alone provides accurate statics in a complex area. In this study, we introduce a joint application of these two methods to obtain accurate statics in both layered and continuous near surface media. Our study shows that both short wavelength and long wavelength statics are accurate when the joint method is applied.