Abstract
This chapter discusses electron holography. Interest in electron holography is currently on the upswing because of recent improvements in electron beam coherence that has brought the technology closer to practical realization. The chapter discusses recent progress in the area of experimental research regarding electron holography is reviewed. It needs to be stated, however, that, as this new field is currently in a state of rapid change, it is difficult at this early stage to describe accurately the present status of each part of it. The original objective of electron holography, that is, improvement of electron microscope resolution, is confirmed. The current outlook is that it is possible to attain an ultra-high resolution of less than 1 Å by correcting aberrations. Holographic interference microscopy displays phase distributions as contour fringes in an electron micrograph. This has opened up new practical applications, such as the observation of microscopic magnetic lines of force. Holographic techniques can be effectively used to detect very small phase shifts.
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