Abstract
A low-cost tin thin film with different thicknesses was deposited on ITO covered silica substrates via magnetron sputtering. The structure, surface morphology, and optical properties of tin/ITO thin films were investigated via X-ray diffraction (XRD), atomic force microscopy (AFM), UV–VIS-NIR double beam spectrometer, and Raman system, respectively. The results show that by controlling the thickness of the tin thin film with ITO, red shift of the surface plasmon resonance wavelength was achieved and the surface-enhanced Raman scattering (SERS) was enhanced. On the contrary, when no ITO layer was employed in the system, the variation of the tin film thickness did not cause a significant change in the resonance wavelength. Additionally, Finite-Difference Time-Domain (FDTD) was performed for the surface plasmon resonance properties of the samples, and the simulation results were consistent with the experiments.
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