Abstract
Phase retrieval is a central problem in coherent x-ray diffraction microscopy. Various methods have been proposed to solve the problem with the most successful being iterative methods with a finite spatial support constraint. In this work, a new constraint is formulated in the wavelet domain using low-resolution a priori information. Experimental results indicate that the constraint is sufficient to reconstruct an object from Fourier modulus measurements.
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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