Abstract
The test and evaluation of long wave infrared (LWIR) hybrids is not an insignificant task, especially when large numbers of devices need to be examined. Device temperatures are typically below 20 degrees Kelvin, and low optical backgrounds are imperative. Noise equivalent irradiance (NEI) measurements require exceedingly low station noise floors, while the desire to reduce integration times calls for faster acquisition systems. Reporting data on the large number of pixels in a typical array demands a streamlined way to relate the performance of the part to the test engineer. A hybrid, as used in this paper, is a detector array that is indium bumped to a readout chip. It is also commonly referred to as a sensor chip assembly (SCA). This paper describes some of the hybrid testing developed on the Precursor Above the Horizon Sensor (PATHS) program as well as a few techniques that proved invaluable for the characterization of the low background LWIR hybrids.
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