Abstract
FeSe thin films are prepared on GaAs (1 0 0) substrate by a selenization technique. Surface images observed by scanning electron microscopy (SEM) show polycrystallinity of the films. The sample of 600 nm thickness consists of grains of about 300 nm in diameter with no crystal orientation. An isotropic magnetization for both directions of in-plane and perpendicular to the films is obtained from a M-H curve measured by a vibrating sample magnetometer, which is consistent with the SEM observation.
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