Abstract
The re-emission of H and D atoms, implanted into graphite, induced by 1.5 MeV He+bombardment has been studied by means of the elastic recoil detection (ERD) technique by changing the initial peak concentration of H and D, the temperature and the He+ ion flux. The experimental re-emission profiles were analyzed solving analytically the mass balance equations. The whole re-emission profiles are shown to be excellently reproduced in terms of the ion- induced detrapping (σd), trapping (or retrapping) (ΣT ) and local molecular recombination (k) between an activated (free) hydrogen atom and a trapped one and that the effective detrapping cross sections ΣdK/ΣT for H and D are determined as the best fitting parameter to be 2.9xl0-18 and 7.7x 10-19 cm2, respectively. It is also shown from the experimental data on little dependence of the re-emission profile on the He+ ion flux that the local molecular recombination plays a major role in the ion-induced re-emission. Furthermore, the difference between the effective...
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