Abstract
We present IsoSense, a wavefront sensing method that mitigates sample dependency in image-based sensorless adaptive optics applications in microscopy. Our method employs structured illumination to create additional high spatial frequencies in the image through custom illumination patterns. This improves the reliability of image quality metric calculations and enables sensorless wavefront measurement even in samples with sparse spatial frequency content. We demonstrate the feasibility of IsoSense for aberration correction in a deformable-mirror-based structured illumination super-resolution fluorescence microscope.
Highlights
Sensorless adaptive optics (AO) [1] is an aberration measurement technique in which optimum aberration correction is inferred from a collection of intentionally aberrated images
We have demonstrated its performance in structured illumination microscopy (SIM) [18,19,20], because this technique is sensitive to the fidelity of imaging high spatial frequencies [21], and the equipment for its implementation is readily capable of forming custom illumination patterns
The IsoSense structured-illumination-based sensorless AO approach removes the barriers to accurate image quality metric calculation, commonly caused by anisotropic object structure or lack of sharp and well-defined structures
Summary
Sensorless adaptive optics (AO) [1] is an aberration measurement technique in which optimum aberration correction is inferred from a collection of intentionally aberrated images It has found widespread use in various forms of high-resolution microscopy, in addition to optical coherence tomography [2,3], spectroscopy [4], and laser communications [5]. When there is a strong anisotropy to the structures, such as when the specimen consists of aligned linear components, there can be a bias in the measurements The reason for this bias is that certain aberration modes have a greater effect than others on particular spatial frequencies. We have demonstrated its performance in structured illumination microscopy (SIM) [18,19,20], because this technique is sensitive to the fidelity of imaging high spatial frequencies [21], and the equipment for its implementation is readily capable of forming custom illumination patterns
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