Abstract
Even low power reactors, such as zero power reactors, are sufficient for semiconductor radiation hardness effect investigation. This reflects the fact that fluxes necessary for affecting semiconductor electrical resistance are much lower than fluxes necessary to affect material parameters. The paper aims to describe the irradiation possibilities of the LR-0 reactor with a special core arrangement corresponding to VVER-1000 dosimetry Mock-Up.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.