IP Session on Machine Learning Applications in IC Test-Related Tasks

Abstract

Over the last decade there has been a surge of activity in employing advanced statistical analysis and machine learning methods to various test-related tasks. The topic is no longer simply a matter of academic curiosity but, rather, a pressing need of the industry as it seeks to address various challenges. In this session, three industry experts have been invited to give their perspective, describe machine learning use cases, and discuss challenges and future work ideas. The three talks will cover the use of deep learning for hotspot detection, the challenge of rendering machine learning-based decisions in the semiconductor industry trustable and explainable, and data analytics across the the complete product cycle towards improved product reliability.