Abstract
The combined use of IL and PIXE is promising in characterizing the inorganic materials. IL is sensitive to the condition of chemical binding and ion valence state, crystallinity and defects. IL can also provide a unique way to monitor and study the ion-beam induced effects in samples. PIXE can provide quantitative information on the elemental distribution of major and trace elements in samples, which in turn helps to understand IL results. The combination of the two techniques provides a new tool for studying the intrinsic and extrinsic luminescence phenomena and is capable of micro-characterizing various inorganic materials, including the ones of geological and synthetic origins.
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