Abstract
The formation probability of secondary ions released from a metal surface under bombardment with a 20-keV cluster ion beam is investigated using combined time-of-flight secondary ion and neutral mass spectrometry (Tof-SIMS/SNMS) experiments. The emitted neutral atoms and clusters are post-ionized after their ejection using strong-field photoionization in an intense short infrared laser pulse. Comparing the secondary ion signal with that of the corresponding neutral particles, the ionization probability of sputtered indium atoms and Inn clusters with n = 2–4 is determined. The results are compared between two different projectile cluster ions, namely i) C60+ and ii) Arn+ with n∼1000. It is shown that the ionization probability obtained with the fullerene cluster is by roughly a factor 4 larger than that obtained with the rare gas cluster, thereby indicating that there is no nonlinear enhancement of the transient electronic excitation generated by a cluster impact.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
